I'm happy to report that this paper was a Best SIPI Paper finalist at the conference! While I was unable to attend in-person due to a missed flight, the paper has been published to IEEE Xplore here.

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Some initial research points to yes, for certain applications. Here's a preview of a paper I'll be sharing at this year's IEEE EMC+SIPI conference in Spokane. There's still a lot of work to be done, and I'm admittedly quite a machine learning amateur. Even so, I think there are areas in signal integrity where we can find smart ways to apply machine learning to speed up design cycle time.

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